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Illumination and voltage effects on the forward and reverse bias current-voltage (I-V) characteristics in In/In2S3/p-Si photodiodes

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dc.contributor.author YÜKSELTÜRK, ESRA
dc.date.accessioned 2021-12-17T07:45:19Z
dc.date.available 2021-12-17T07:45:19Z
dc.date.issued 2021
dc.identifier.issn 0957-4522
dc.identifier.uri http://earsiv.ostimteknik.edu.tr:8080/xmlui/handle/123456789/94
dc.description.abstract The illumination and voltage effects on the I-V measurements of the fabricated In/In2S3/p-Si photodiode were investigated in dark and under various illumination intensities (20-100 mW/cm(2)) between +/- 2 V. Two linear regions in the forward-bias ln(I)-V plots were observed. The value of diode ideality factor (n) had an increasing trend with increasing illumination intensity while the barrier height (phi(Bo)) had a decreasing trend due to the increase of photocurrent. The photodiode properties were also investigated, and the value of linear-dynamic value range (LDR) was found to be 20.56 dB. The photoresponse (I-ph/I-dark), the photoresponsivity (R), and specific detectivity (D*) of the photodiode were calculated as a function of the illumination. The open-circuit voltage (V-oc) and short-current (I-sc) were found to be 0.36 V and 2.87 mA under 100 mW.cm(-2) illumination intensity, respectively. The possible conduction mechanisms (CMs) were investigated using the forward ln(I)-V and reverse ln(I)-V-0.5 plots. The energy-dependent surface states (N-ss) profile was extracted from the positive I-V data by considering voltage-dependent barrier height (BH) and ideality factor (n) in dark and illumination at 100 mW/cm(2). en_US
dc.language.iso en en_US
dc.subject THIN-FILMS en_US
dc.subject ELECTRICAL-PROPERTIES en_US
dc.subject OPTICAL-PROPERTIES en_US
dc.subject SCHOTTKY DIODES en_US
dc.subject IN2S3 en_US
dc.subject HETEROJUNCTION en_US
dc.subject LAYER en_US
dc.subject TRANSPORT en_US
dc.subject CD en_US
dc.subject FABRICATION en_US
dc.title Illumination and voltage effects on the forward and reverse bias current-voltage (I-V) characteristics in In/In2S3/p-Si photodiodes en_US
dc.type Article en_US


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